| MRC | Criteria | Characteristic |
|---|
| ADAQ | BODY LENGTH | 2.076 INCHES MINIMUM AND 2.096 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.600 INCHES MINIMUM AND 0.620 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.205 INCHES MINIMUM AND 0.225 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
| CSSL | DESIGN FUNCTION AND QUANTITY | 1 GATE,ARRAY |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-5 MIL-M-38510 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,PROGRAMMED |
| FEAT | SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENSITIVE; ALTERED ITEM,DEVICE TO BE PROGRAMMED IS 5962-8854801QA,FILENAME 1058-U24.JED,FD137200069-001,CHECKSUM 7F34; NHA PN 1372AE1058 |
| CBBL | FEATURES PROVIDED | BURN IN AND ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND PROGRAMMED AND ULTRAVIOLET ERASABLE AND W/CLOCK |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| AGAV | END ITEM IDENTIFICATION | EO LOROPS |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQZP | INPUT CIRCUIT PATTERN | 38 INPUT |
| CZEQ | TIME RATING PER CHACTERISTIC | 60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT AND 60.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT |
| TTQY | TERMINAL TYPE AND QUANTITY | 40 PRINTED CIRCUIT |
| AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -2.0 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
