MRC | Criteria | Characteristic |
---|
ADAQ | BODY LENGTH | 1.415 INCHES MAXIMUM" |
ADAT | BODY WIDTH | 0.605 INCHES MAXIMUM" |
ADAU | BODY HEIGHT | 0.210 INCHES MAXIMUM" |
AEHX | MAXIMUM POWER DISSIPATION RATING | 790.0 MILLIWATTS" |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS" |
AFJQ | STORAGE TEMP RANGE | -65.0/+125.0 DEG CELSIUS" |
AGAV | END ITEM IDENTIFICATION | F-15 AVIONICS" |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND W/BUFFERED OUTPUT AND W/ENABLE AND HIGH SPEED AND ULTRAVIOLET ERASABLE" |
CQSJ | INCLOSURE MATERIAL | CERAMIC" |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC" |
CQZP | INPUT CIRCUIT PATTERN | 16 INPUT" |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, DIGITAL - CMOS EPROM MSB" |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.0 VOLTS MAXIMUM POWER SOURCE" |
CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
CZER | MEMORY DEVICE TYPE | EPROM" |
CZZZ | MEMORY CAPACITY | 65536 BIT 8192 WORD" |
FEAT | SPECIAL FEATURES | PROGRAM TO CAGE 07187 TRUTH TABLE TT8513345-110" |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)." |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT" |
ADAQ | BODY LENGTH | 1.415 INCHES MAXIMUM" |
ADAT | BODY WIDTH | 0.605 INCHES MAXIMUM" |
ADAU | BODY HEIGHT | 0.210 INCHES MAXIMUM" |
AEHX | MAXIMUM POWER DISSIPATION RATING | 790.0 MILLIWATTS" |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS" |
AFJQ | STORAGE TEMP RANGE | -65.0/+125.0 DEG CELSIUS" |
AGAV | END ITEM IDENTIFICATION | F-15 AVIONICS" |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND W/BUFFERED OUTPUT AND W/ENABLE AND HIGH SPEED AND ULTRAVIOLET ERASABLE" |
CQSJ | INCLOSURE MATERIAL | CERAMIC" |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC" |
CQZP | INPUT CIRCUIT PATTERN | 16 INPUT" |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER" |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, DIGITAL - CMOS EPROM MSB" |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.0 VOLTS MAXIMUM POWER SOURCE" |
CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
CZER | MEMORY DEVICE TYPE | EPROM" |
CZZZ | MEMORY CAPACITY | 65536 BIT 8192 WORD" |
FEAT | SPECIAL FEATURES | PROGRAM TO CAGE 07187 TRUTH TABLE TT8513345-110" |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.)." |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT" |