Thank you for your interest in part number AT27C512-250M 883, a component manufactured by Atmel Corporation that we sell here on NSN Parts Finder. For your reference, this item is presented with the NSN 5962-01-326-2822 and features the description “Microcircuit Memory.” To request a quote for part number AT27C512-250M 883, simply fill out the form below with key details like your budget, required quantity, and anticipated fulfillment timeline. Within 15 minutes of receiving and reviewing your submission, our staff members will present you with competitive purchasing options tailored to your needs. Alternatively, you are also welcome to give us a call or email, and we will gladly guide you through the quotation process or discuss any custom solutions you happen to be seeking.
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With a global supply chain and ample purchasing power, we can provide highly competitive pricing and swift lead times on numerous NSN 5962-01-326-2822 products. More than that, we exclusively procure our inventory from reliable manufacturers to guarantee quality, including this component from Atmel Corporation, which is associated with the CAGECode 1FN41. Keeping this in mind, get in touch with our specialists today to secure a quote on the FSC 5962 Microcircuits Electronic part number AT27C512-250M 883.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-326-2822 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013262822 | N | B | ||
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| B | A | 0 | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| AM27C512-250/BXA | 2 | 9 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
| CBBL | FEATURES PROVIDED | ULTRAVIOLET ERASABLE AND MONOLITHIC AND PROGRAMMABLE AND W/BUFFERED OUTPUT AND W/ENABLE AND ELECTROSTATIC SENSITIVE |
| CSWJ | WORD QUANTITY | 65536 |
| FEAT | SPECIAL FEATURES | NUCLEAR HARDNESS CRITICAL ITEM |
| ABKW | OVERALL HEIGHT | 0.432 INCHES MAXIMUM |
| ADAQ | BODY LENGTH | 1.490 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.172 INCHES MINIMUM AND 0.217 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 18 INPUT |
| CRHL | BIT QUANTITY | 524288 |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-10 MIL-M-38510 |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 14.0 VOLTS MAXIMUM POWER SOURCE |
| AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZER | MEMORY DEVICE TYPE | ROM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 825.0 MILLIWATTS |
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